Agenda

03 Lug 2020 15:00

Machine Learning-based Pattern Recognition, e.g. for Document Analysis

Seminario online

With Stadelmann Thilo, ECLT Fellow / Professor at ZHAW School of Engineering and Scientific Director at ZHAW digital

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Abstract
Following ECLT's recommendation to get to know the members, this seminar serves two purposes: (a) to quickly introduce my group at the ZHAW Zurich Unversity of Applied Science in Switzerland, which focuses on dee learning-based pattern recognition for diverse use cases; (b) to spice this up, the largest part of the presentation will revolve around two concrete examples from our portfolio of industrial use case-driven research. We will present the challenges of industrial-strengh optical music recognition (OMR) as well as print media monitoring, and our novel deep learning-based solutions. The goal of this presentation is to introduce you to a novel object detection method that excels at finding many tiny objects in large images (also relevant in e.g. medical image processing), and to break the ice for potential future exchange and collaboration.

Lingua

L'evento si terrà in inglese

Organizzatore

ECLT

Link

http://www.unive.it/eclt

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