MICROSCOPY AND STRUCTURAL CHARACTERIZATION TECHNIQUES - MOD. 2

Academic year
2017/2018 Syllabus of previous years
Official course title
MICROSCOPY AND STRUCTURAL CHARACTERIZATION TECHNIQUES - MOD. 2
Course code
CM1327 (AF:259665 AR:142000)
Modality
On campus classes
ECTS credits
6 out of 12 of MICROSCOPY AND STRUCTURAL CHARACTERIZATION TECHNIQUES
Degree level
Master's Degree Programme (DM270)
Educational sector code
CHIM/02
Period
2nd Semester
Course year
1
The basic principle of electron microscopy will be outlined and developed in order to understand the characteristic and properties of these modern instruments used in the characterization of nanostructured materials. The course will start from the basic principle of geometrical optics and then the new knowledge necessary to understand the functioning of an electron microscope will be built step by step. At the end of the course the students will be able to interpret an electron microscopy image and to obtain from it the atomic and structural-morphological properties of interest. The practical part (laboratory end exercises) will be mainly focused on the study of nanoparticles and of nanostructured and hybrid materials.
Calculus, quantum mechanics and physics courses
The Human eye: how it works and its limitation
geometrical optics: thin lens equation, lens aberration, lens systems;
Light-optic Microscopy;
Electron Optics; properties of a thin magnetic lens, defect of electron lenses;
Electron gun: thermoionic and field emission;
Kinematic of scattering by an atomic nucleus; electron-electron scattering; the dynamic of scattering;
Transmission electron microscopy: types of contrast: scattering contrast, diffraction contrast. Electron diffraction; bright field and dark field images; phase contrast. High resolution TEM. TEM specimen preparation.
Scanning electron microscopy: operating principles, secondary electrons, backscattered electrons. The environmental SEM; SEM specimen preparation.
Analytical electron microscopy.
Physical principles of Electron Microscopy,An Introduction to TEM, SEM, and AEM. Ray F. Egerton; Springer (2005)

Transmission Electron Microscopy: A Textbook for Materials Science.
David B. Williams, C. Barry Carter, Springer; 2nd edition (2009).
written
The knowledge acquired by the students will be verified through written examinations.
The students will be asked to solve some numerical exercises related to the arguments explained during lessons. Furthermore the students will be asked to answer some theoretical questions about topics developed during classes.
face to face lessons
English
  • Course with sustainable contents
  • University credits of sustainability: 2
  • Lecture notes, material for reference or for self-assessment available online or as e-book
  • Use of virtual forum, blog or wiki
  • Use of open-source software
Last update of the programme: 27/02/2017